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BS IEC 61636:2016

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Software Interface for Maintenance Information Collection and Analysis (SIMICA)

Available format(s)

Hardcopy , PDF

Superseded date

22-06-2021

Superseded by

BS IEC 61636:2021

Language(s)

English

Published date

31-01-2023

€271.12
Excluding VAT

1 Overview
2 Normative references
3 Definitions
4 Backgrounds
5 Information model
6 Conformance
Annex A (informative) - Bibliography
Annex B (informative) - Overview of EXPRESS
Annex C (informative) - IEEE list of participants

Describes a software interface for access, exchange, and analysis of product diagnostic and maintenance information.

Committee
EPL/501
DocumentType
Standard
Pages
42
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

This standard is an implementation-independent specification for a software interface to information systems containing data pertinent to the diagnosis and maintenance of complex systems consisting of hardware, software, or any combination thereof. These interfaces will support service definitions for creating application programming interfaces (API) for the access, exchange, and analysis of historical diagnostic and maintenance information. The standard will use the information models of IEEE Std 1232 as a foundation.

Standards Relationship
IEC 61636:2016 Identical

IEEE 1671.4-2014 IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
ISO 10303-11:2004 Industrial automation systems and integration Product data representation and exchange Part 11: Description methods: The EXPRESS language reference manual
IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

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