Skip to content
Please enter a keyword to search

  • IEEE 1671.1-2009

    View superseded by
    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
    View superseded by

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

    Available format(s):  PDF

    Superseded date:  11-12-2013

    Language(s):  English

    Published date:  11-12-2009

    Publisher:  Institute of Electrical & Electronics Engineers

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    1. Overview
    2. Normative references
    3. Definitions, acronyms, and abbreviations
    4. Test Description schema
    5. Describing test program structure
    6. Describing control flow
    7. Describing data
    8. Describing test behavior
    9. Describing fault isolation
    10. ATML Test Description XML schema names and
        locations
    11. ATML XML schema extensibility
    12. Conformance
    Annex A (normative) - XML schemas
    Annex B (informative) - TSF library examples
    Annex C (informative) - Describing digital testing
    Annex D (informative) - Describing serial digital bus exchanges
    Annex E (informative) - IEEE download web-site material
            associated with this document
    Annex F (informative) - Users information and examples
    Annex G (informative) - Glossary
    Annex H (informative) - Bibliography

    Abstract - (Show below) - (Hide below)

    The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT.

    General Product Information - (Show below) - (Hide below)

    Committee SCC20 - Test and Diagnosis for Electronic Sys
    Document Type Standard
    Publisher Institute of Electrical & Electronics Engineers
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
    DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
    IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
    IEC 61636-99:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements
    IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
    IEEE 1636.99-2013 IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.
    BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
    BS IEC 61636:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA)
    BS IEC 61636-1:2016 Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
    IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    IEC 61636-1:2016 Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML)
    BS IEC 61636-99:2016 Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements
    IEC 61636:2016 Software interface for Maintenance Information Collection and Analysis (SIMICA)
    IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
    IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    IEEE 488.1 : 2003 STANDARD FOR HIGHER PERFORMANCE PROTOCOL FOR THE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
    IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)
    MIL-HDBK-1553 Revision A:1988 Multiplex Application Handbook
    IEEE 488.2 : 1992 STANDARD CODES, FORMATS, PROTOCOLS, AND COMMON COMMANDS FOR USE WITH IEEE 488.1-1987, IEEE STANDARD DIGITAL INTERFACE FOR PROGRAMMABLE INSTRUMENTATION
    MIL-STD-1345 Revision B:1981 TEST REQUIREMENT DOCUMENT PREPARATION OF
    IEEE 1641-2004 IEEE Standard for Signal and Test Definition
    IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
    IEEE 1671-2006 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    MIL-STD-1519 Base Document:1971 TEST REQUIREMENTS DOCUMENT, PREPARATION OF
    IEEE 754-2008 REDLINE IEEE Standard for Floating-Point Arithmetic
    MIL-STD-1553 Revision B:1978 DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA
    View more information

    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective