• BS IEC 61671-2:2016

    Current The latest, up-to-date edition.

    Standard for automatic test markup language (ATML) instrument description

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-04-2016

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions
     abbreviations
     and acronyms
    4 InstrumentDescription schema
    5 InstrumentDescription instance schema
    6 ATML InstrumentDescription XML schema
      names and locations
    7 ATML XML schema extensibility
    8 Conformance
    Annex A (informative) - IEEE download Web site material
            associated with this document
    Annex B (informative) - Users information and examples
    Annex C (informative) - Glossary
    Annex D (informative) - Bibliography
    Annex E (informative) - IEEE List of Participants

    Abstract - (Show below) - (Hide below)

    Specifies an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

    Scope - (Show below) - (Hide below)

    This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/501
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
    IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
    TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
    IEEE 802.3-2012 IEEE Standard for Ethernet
    IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
    MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT
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