IEEE 1671.6-2015
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
Hardcopy , PDF
English
08-05-2015
26-03-2026
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Schema - TestStationDescription.xsd
5 Schema - TestStationInstance.xsd
6 ATML TestStationDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
material associated with this document
Annex B (informative) - User's information and
examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
PDF along with XML Schemas and reference example files is also available in zip format. (05/2015) Also numbered as IEC 61671-6. (04/2016)
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-9624-4
|
| Pages |
34
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| BS IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| IEEE 1871.2-2017 | IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment |
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
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