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BS IEC 62341-1-1 : 2009

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 1-1: GENERIC SPECIFICATIONS

Available format(s)

Hardcopy , PDF

Superseded date

30-06-2010

Superseded by

BS EN 62341-1-1:2009

Language(s)

English

Published date

01-01-2009

€217.36
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, units and symbols
4 Technical aspects
  4.1 Order of precedence
  4.2 Standard atmospheric conditions
  4.3 Marking
      4.3.1 Device identification
      4.3.2 Device traceability
      4.3.3 Packing
  4.4 Categories of assessed quality
  4.5 Screening
  4.6 Handling
5 Quality assessment procedures
  5.1 Eligibility for qualification approval
  5.2 Primary stage of manufacture
  5.3 Commercially confidential information
  5.4 Formation of inspection lots
  5.5 Structurally similar devices
  5.6 Subcontracting
  5.7 Validity of release
6 Quality approval procedure
  6.1 Granting of qualification approval
  6.2 Quality conformance inspection requirements
      6.2.1 Division into groups and subgroups
      6.2.2 Quality conformance Inspection requirements
      6.2.3 Supplementary procedure for reduced inspection
      6.2.4 Sampling requirements for small lots
      6.2.5 Certified records of released lots (CRRL)
      6.2.6 Delivery of devices subjected to destructive
            or non-destructive test
      6.2.7 Delayed deliveries
      6.2.8 Supplementary procedure for deliveries
  6.3 Statistical sampling procedures
      6.3.1 AQL sampling plans
      6.3.2 LTPD sampling plans
  6.4 Endurance tests
      6.4.1 General
      6.4.2 Endurance tests where the failure rate is specified
  6.5 Accelerated test procedures
7 Capability approval procedure
8 Test and measurement procedures
  8.1 Standard environmental conditions
      8.1.1 Dark room condition
      8.1.2 Standard setup condition
      8.1.3 Standard atmospheric conditions for measurements
  8.2 Physical examination
      8.2.1 Visual examination
      8.2.2 Dimensions
      8.2.3 Weight
      8.2.4 Permanence of marking
  8.3 Electrical and optical measurement
      8.3.1 General conditions and precautions
  8.4 Environmental test
  8.5 Endurance test
Annex A (informative) - Lot tolerance percentage defective
         (LTPD) sampling plans
Bibliography

Describes general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.

Committee
EPL/47
DevelopmentNote
Supersedes 05/30143244 DC. (07/2009) Renumbered and superseded by BS EN 62341-1-1. (06/2010)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 62341-1-1:2009 Identical

IEC 62341-1-2:2014 Organic light emitting diode (OLED) displays - Part 1-2: Terminology and letter symbols
ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 62341-5:2009 Organic light emitting diode (OLED) displays - Part 5: Environmental testing methods
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60027-4:2006 Letter symbols to be used in electrical technology - Part 4: Rotating electric machines
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

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