BS ISO 13095:2014
Current
The latest, up-to-date edition.
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Hardcopy , PDF
English
31-08-2014
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Procedure for probe characterization
6 Reporting of probe characteristics
Annex A (informative) - Dependence of AFM images on
measurement mode and settings
Annex B (normative) - Reference sample preparation
Annex C (informative) - Example of a reference structure
Annex D (informative) - Results of EPSC measurement
repeatability test
Annex E (informative) - Plane correction for probe shank
profile analysis
Annex F (informative) - Example of a report
Bibliography
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