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11/30199166 DC : 0
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BS ISO 11952 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - DETERMINATION OF GEOMETRIC QUANTITIES USING SPM - CALIBRATION OF MEASURING SYSTEMS |
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ISO 11775:2015
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Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants |
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BS PD ISO/TS 80004-6 : 2013
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NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION |
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CEN ISO/TS 80004-6:2015
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NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013) |
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BS ISO 28600:2011
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Surface chemical analysis. Data transfer format for scanning-probe microscopy |
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ASTM E 2859 : 2011
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Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
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S.R. CEN ISO/TS 80004-6:2015
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NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013) |
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BS ISO 23833:2013
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Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary |
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ISO/TS 80004-13:2017
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Nanotechnologies Vocabulary Part 13: Graphene and related two-dimensional (2D) materials |
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ASTM E 2735 : 2014 : REDLINE
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Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
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ISO 27911:2011
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Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope |
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16/30300288 DC : 0
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BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY |
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13/30203230 DC : 0
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BS ISO 13095 - SURFACE CHEMICAL ANALYSIS - ATOMIC FORCE MICROSCOPY - PROCEDURE FOR IN SITU CHARACTERIZATION OF AFM PROBE SHANK PROFILE USED FOR NANOSTRUCTURE MEASUREMENT |
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BS ISO 13095:2014
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Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
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BS ISO 11039:2012
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Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate |
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BS ISO 20579-4:2018
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Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
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ASTM E 2859 : 2011 : R2017
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Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
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ISO 20579-4:2018
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Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
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ISO 11952:2014
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Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems |
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ISO/TR 19693:2018
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Surface chemical analysis Characterization of functional glass substrates for biosensing applications |
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PD ISO/TS 80004-13:2017
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Nanotechnologies. Vocabulary Graphene and related two-dimensional (2D) materials |
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PD CEN ISO/TS 80004-6:2015
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Nanotechnologies. Vocabulary Nano-object characterization |
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ISO 13095:2014
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Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
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ASTM E 1829 : 2014 : REDLINE
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Standard Guide for Handling Specimens Prior to Surface Analysis |
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ISO/TR 18196:2016
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Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
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ISO/TS 80004-6:2013
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Nanotechnologies Vocabulary Part 6: Nano-object characterization |
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BS ISO 19606:2017
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Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy |
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BS ISO 19668:2017
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Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials |
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ISO 11039:2012
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Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
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ISO 19668:2017
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Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials |
|
BS ISO 27911:2011
|
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope |
|
BS ISO 11775:2015
|
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants |
|
BS ISO 13083:2015
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Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
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10/30199182 DC : 0
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BS ISO 11039 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - MEASUREMENT OF DRIFT RATE |
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PD ISO/TR 18196:2016
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Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
|
ISO 28600:2011
|
Surface chemical analysis Data transfer format for scanning-probe microscopy |
|
ISO 20411:2018
|
Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry |
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ISO 19606:2017
|
Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy |
|
ISO 23833:2013
|
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
|
ISO 13083:2015
|
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
|
ASTM E 1078 : 2014 : REDLINE
|
Standard Guide for Specimen Preparation and Mounting in Surface Analysis |