BS ISO 16243:2011
Current
The latest, up-to-date edition.
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Hardcopy , PDF
English
31-12-2011
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Levels of recording and reporting
5 Release of data to the customer
Annex A (informative) - Examples of spectra
Bibliography
Describes the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS).
| Committee |
CII/60
|
| DevelopmentNote |
Supersedes 10/30199175 DC. (12/2011)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
| Standards | Relationship |
| ISO 16243:2011 | Identical |
| ISO 15472:2010 | Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO 18117:2009 | Surface chemical analysis — Handling of specimens prior to analysis |
| ISO/TR 15969:2001 | Surface chemical analysis — Depth profiling — Measurement of sputtered depth |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
| ISO 20903:2011 | Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results |
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