BS ISO 17862:2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Hardcopy , PDF
31-10-2022
English
31-12-2013
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Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Procedure for evaluating the intensity linearity
5 Interval for repeat measurements
Annex A (normative) - Computation of raster size,
ion beam current, number of frames for
analysis, and counts per pulse
Annex B (normative) - Charge compensation setting
Annex C (normative) - Ion detector setting
Annex D (informative) - Instrumental factors affecting
linearity
Bibliography
Describes a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE).
| Committee |
CII/60
|
| DevelopmentNote |
Supersedes 13/30261587 DC. (01/2014)
|
| DocumentType |
Standard
|
| Pages |
36
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This International Standard specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95% linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. This International Standard can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.
| Standards | Relationship |
| ISO 17862:2013 | Identical |
| ISO 23830:2008 | Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
| ISO 13084:2011 | Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer |
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