BS ISO 19668:2017
Current
The latest, up-to-date edition.
Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
Hardcopy , PDF
English
18-09-2017
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Calculating and reporting detection limits
from XPS data
Annex A (informative) - Uncertainties associated
with XPS detection limits
Annex B (informative) - Definition of XPS detection
limits
Annex C (informative) - Examples
Annex D (informative) - Detection limit conversions
Bibliography
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.