BS QC 760200:1997

Current

Current The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

Available format(s): Hardcopy, PDF

Language(s): English

Published date: 15-08-1997

Publisher: British Standards Institution

Table of Contents - (Show below) - (Hide below)

1 Scope and object
2 General, preferred characteristics, ratings and
    severities for environmental tests
    2.1 Normative references
    2.2 Preferred ratings and characteristics
    2.3 Information to be given in a detail specification
3 Capability approval procedures
    3.1 Selection of capability qualifying circuits (CQCs)
    3.2 Structural similarity
    3.3 Capability approval
    3.4 Resubmission of rejected lots (lot-by-lot
          inspection)
    3.5 Manufacturing stages in a factory of an approved
          manufacturer in a non-IEC member country
4 Test and measurement procedures
5 Tables for method B
Annexes
A Structural similarity rules for capability approval
B Minimum contents of a manufacturer's capability
    manual for thick film circuits
C Minimum contents of a manufacturer's capability manual
    for thin film circuits
Tables
1 Test schedule for capability approval for method A
2 Assessment levels and acceptance criteria for capability
    approval for method A
3 Assessment levels and acceptance criteria for quality
    conformance inspection for method A
4 Screening
5 Test schedule for capability approval for method B
6 Assessment levels and acceptance criteria for
    capability approval for method B
7 Assessment levels and acceptance criteria for quality
    conformance inspection for method B

Abstract - (Show below) - (Hide below)

Applicable to film integrated circuits and hybrid film integrated circuits manufactured as catalogue circuits when quality is assessed on a basis of capability approval.

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Committee	EH/4
Development Note	Supersedes BS QC760200(1992) and 95/200682 DC. To be read in conjunction with BS QC 760000(1990) Also numbered as IEC 60748-22. (09/2003)
Document Type	Standard
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Current
Supersedes	BS QC 760200:1992

Standards Referencing This Book - (Show below) - (Hide below)

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
BS QC 760000:1990	Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
IEC TR 60440:1973	Method of measurement of non-linearity in resistors
IEC 60063:2015	Preferred number series for resistors and capacitors
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60748-20-1:1994	Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
IEC 60748-21:1997	Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
IEC 60748-22-1:1997	Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

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