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CEI EN 60444-11 : 2011

Current

Current

The latest, up-to-date edition.

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2011

€55.57
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 General concepts
4 Reference plane and
  test conditions
Bibliography

Defines the standard method of measuring load resonance frequency f[L] at the nominal value of C[L], and the determination of the effective load capacitance C[Leff] at the nominal frequency for crystals with the figure of merit M > 4.

Committee
CT 309
DevelopmentNote
Classificazione CEI 309-22. (03/2011)
DocumentType
Standard
Pages
22
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 60444-11:2010 Identical
EN 60444-11:2010 Identical

EN 60444-4:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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