• CEI EN 60747-5-3 : 2002

    Current The latest, up-to-date edition.

    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

    Available format(s):  Hardcopy, PDF

    Language(s):  English, English - French

    Published date:  01-01-2002

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Measuring methods for
      photoemitters
    4 Measuring methods for
      photosensitive devices
    5 Measuring methods for
      photocouplers
    Annex A (informative) - Cross
            references index

    Abstract - (Show below) - (Hide below)

    Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee CT 309
    Development Note Classificazione CEI 47-1013. (08/2015)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    EN 60068-1:2014 Environmental testing - Part 1: General and guidance
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