• EN 60747-5-3:2001/A1:2002

    Current The latest, up-to-date edition.

    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

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    Published date:  24-05-2002

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 Scope
    2 Normative references
    3 Measuring methods for photoemitters
      3.1 Luminous intensity of light-emitting diodes (I[v])
      3.2 Radiant intensity of infrared-emitting diodes (I[e])
      3.3 Peak-emission wavelength (lambda[p]), spectral
           radiation bandwidth (deltalambda), and number of
           longitudinal modes (n[m])
      3.4 Emission source length and width and astigmatism
           of a laser diode without pigtail
      3.5 Half-intensity angle and misalignment angle of
           a photoemitter
    4 Measuring methods for photosensitive devices
      4.1 Reverse current under optical radiation of
           photodiodes including devices with or without
           pigtails (I[R(H)] or I[R(E)]), and collector
           current under optical radiation of phototransistors
           (I[C(H)] or I[C(E)])
      4.2 Dark current for photodiodes I[R] and dark currents
           for phototransistors I[CEO], I[ECO], I[EBO]
      4.3 Collector-emitter saturation voltage V[CE(sat)] of
           phototransistors
    5 Measuring methods for photocouplers
      5.1 Current transfer ratio (h[F(ctr)])
      5.2 Input-to-output capacitance (C[io])
      5.3 Isolation resistance between input and output
           (r[IO])
      5.4 Isolation test
      5.5 Partial discharges of photocouplers
      5.6 Collector-emitter saturation voltage V[CE(sat)] of
           a photocoupler
      5.7 Switching times t[on], t[off] of a photocoupler
      5.8 Peak off-state current (I[DRM])
      5.9 Peak on-state voltage (V[TM])
      5.10 DC off-state current (I[BD])
      5.11 DC on-state voltage (V[T])
      5.12 Holding current (I[H])
      5.13 Critical rate of rise of off-state voltage (dV/dt)
      5.14 Trigger input current (I[FT])
      5.15 Testing methods of electrical rating for
           phototriac coupler
    Annex A (informative) Cross references index

    Abstract - (Show below) - (Hide below)

    Defines the measuring methods that applies to the optoelectronic devices, which are not intended to be used in the fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee SR 47E
    Development Note To be read in conjunction with IEC 60747-1, EN 62007-1 and EN 62007-2 (02/2003)
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 81-41:2010 Safety rules for the construction and installation of lifts. Special lifts for the transport of persons and goods Vertical lifting platforms intended for use by persons with impaired mobility
    BS EN 60747-5-2 : 2001 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    BS EN 60747-5-5 : 2011 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS
    12/30258453 DC : 0 BS EN 62368-1 AMD - AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS
    I.S. EN 81-41:2010 SAFETY RULES FOR THE CONSTRUCTION AND INSTALLATION OF LIFTS - SPECIAL LIFTS FOR THE TRANSPORT OF PERSONS AND GOODS - PART 41: VERTICAL LIFTING PLATFORMS INTENDED FOR USE BY PERSONS WITH IMPAIRED MOBILITY
    CEI EN 60747-5-2 : 2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    EN 60747-5-5:2011/A1:2015 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS (IEC 60747-5-5:2007/A1:2013)
    IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
    EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    EN 60068-1:2014 ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013)
    IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
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