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CEI EN 60749-17 : 2004

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Available format(s)

Hardcopy , PDF

Superseded date

15-11-2019

Language(s)

English

Published date

01-01-2004

€15.88
Excluding VAT

FOREWORD
1 Scope
2 Terms and definitions
3 General remarks
4 Equipment
5 Test procedure
6 Failure criteria
7 Lot acceptance (for guidance)
8 Detail specification
9 Summary
Bibliography

Defines to determine the susceptibility of semiconductor devices to degradation in the neutron environment.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-31. (01/2005) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
12
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60749-17:2003 Identical
EN 60749-17:2003 Identical

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