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CEI EN 60749-18 : 2004

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)

Available format(s)

Hardcopy , PDF

Superseded date

15-11-2019

Language(s)

English

Published date

01-01-2004

€27.78
Excluding VAT

FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Summary

Describes a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total close) effects from a cobalt-60 ([60]Co) gamma ray source.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-24 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
20
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
EN 60749-18:2003 Identical
IEC 60749-18:2002 Identical

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