CEI EN IEC 60749-18 : 2019
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Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose) Sommario
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2019
Publisher
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
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