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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)
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Available format(s): Hardcopy, PDF
Superseded date: 15-11-2019
Language(s): English
Published date: 01-01-2004
Publisher: Comitato Elettrotecnico Italiano
FOREWORD1 Scope2 Terms and definitions3 Test apparatus4 Procedure5 Summary
Describes a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total close) effects from a cobalt-60 ([60]Co) gamma ray source.
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