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CEI EN 60749-2 : 2004

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

€18.52
Excluding VAT

Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary

Defines the testing of low air pressure on semiconductor devices.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-14 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
14
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
EN 60749-2:2002 Identical
IEC 60749-2:2002 Identical

IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-2-13:1999 Environmental testing - Part 2: Tests - Test M: Low air pressure

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