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  • CEI EN 60749-2 : 2004

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2004

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Test apparatus
    4 Procedure
    5 Summary

    Abstract - (Show below) - (Hide below)

    Defines the testing of low air pressure on semiconductor devices.

    General Product Information - (Show below) - (Hide below)

    Committee CT 309
    Development Note Classificazione CEI 47-14 (04/2004) Supersedes CEI EN 60749. (05/2008)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    EN 60068-2-13:1999 Environmental testing - Part 2: Tests - Test M: Low air pressure
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