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CEI EN 60749-20-1 : 2010

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 20-1: HANDLING, PACKING, LABELLING AND SHIPPING OF SURFACE-MOUNT DEVICES SENSITIVE TO THE COMBINED EFFECT OF MOISTURE AND SOLDERING HEAT

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2010

Superseded date

16-05-2026

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Summarise this standard

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General applicability and
  reliability considerations
5 Dry packing
6 Drying
7 Use
Annex A (normative) - Symbol
        and labels for
        moisture-sensitive
        devices
Annex B (informative) - Board
        rework
Annex C (informative) - Derating
        due to factory environmental
        conditions
Bibliography

Defines to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-66. (09/2010)
DocumentType
Standard
Pages
38
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy

Standards Relationship
IEC 60749-20-1:2009 Identical
EN 60749-20-1:2009 Identical

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A newer version of this standard is available.

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