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  • CEI EN 60749-26 : 2016

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2016

    Publisher:  Comitato Elettrotecnico Italiano

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    Committee CT 309
    Development Note Classificazione CEI 47-56. (06/2007)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current
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