CEI EN 60749-36 : 2004
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
Hardcopy , PDF
English
01-01-2004
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-33. (01/2005) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60749-36:2003 | Identical |
| IEC 60749-36:2003 | Identical |
| EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
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