EN 60749-36:2003

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Current The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

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Published date: 17-04-2003

Publisher: European Committee for Standards - Electrical

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Table of Contents - (Show below) - (Hide below)

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Abstract - (Show below) - (Hide below)

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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Committee	CLC/SR 47
Document Type	Standard
ISBN
Pages
Published
Publisher	European Committee for Standards - Electrical
Status	Current

National Adoptions - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
NF EN 60749-36 : 2003	Identical
IEC 60749-36:2003	Identical
NBN EN 60749-36 : 2004	Identical
NEN EN IEC 60749-36 : 2003	Identical
I.S. EN 60749-36:2003	Identical
PN EN 60749-36 : 2005	Identical
SN EN 60749-36 : 2003	Identical
UNE-EN 60749-36:2004	Identical
BS EN 60749-36:2003	Identical
CEI EN 60749-36 : 2004	Identical
DIN EN 60749-36:2003-12	Identical
BS EN 60601-2-33:2002+A2:2008	Identical

Standards Referencing This Book - (Show below) - (Hide below)

EN 60068-2-7:1993	Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state

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