CEI EN 60749-43 : 1ED 2018
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS
Hardcopy , PDF
English
01-01-2018
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Product categories and applications
5 Failure
6 Reliability test
7 Stress test methods
8 Supplementary tests
9 Summary table of assumptions
10 Summary
Bibliography
Provides guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs).
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-86. (02/2018)
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4471-5
|
| Pages |
46
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-43:2017 | Identical |
| EN 60749-43:2017 | Identical |
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