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CEI EN 60749-44 : 1ED 2017

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Published date

19-07-2017

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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information for the applicable
        procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography

Sets up a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-139. (07/2017)
DocumentType
Standard
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical

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