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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES
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Available format(s): Hardcopy, PDF
Language(s): English
Published date: 01-01-2012
Publisher: Comitato Elettrotecnico Italiano
FOREWORD1 Scope2 Normative references3 Terms and definitions4 Test apparatus5 Procedure6 Failure criteria7 Implementation8 SummaryBibliography
Specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.
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