• CEI EN 61124 : 2013

    Current The latest, up-to-date edition.

    RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2013

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    3 Terms, definitions, abbreviations
      and symbols
    4 General requirements and area of
      application
    5 General test procedure
    6 Sequential test plans
    7 Fixed time/failure terminated test
      plans Fixed duration test plans
    8 Design of alternative time/failure
      terminated test plans
    9 Calendar time/failure terminated
      test plans for non-replaced items
    10 Combined test plans
    11 Performing the test
    12 Presentation of results
    Annex A (normative) - Tables and graphs
            for sequential test plans
    Annex B (normative) - Graphs for fixed
            time/failure terminated test
            plans
    Annex C (normative) - Graphs for
            alternative time/failure
            terminated test plans
    Annex D (normative) - Tables and graphs
            for combined test plans and
            additional sequential test plans
    Annex E (informative) - Examples and
            mathematical references for
            sequential test plans
    Annex F (informative) - Design of
            sequential test plans using a
            common spreadsheet program
    Annex G (informative) - Examples and
            mathematical references for fixed
            time/failure terminated test plans
             Fixed duration test plans
    Annex H (informative) - Design of fixed
            duration time/failure terminated
            test plans using a spreadsheet
            program
    Annex I (informative) - Examples and
            mathematical references for the
            design of alternative time/failure
            terminated test plans
    Annex J (informative) - Examples and
            mathematical references for the
            calendar time terminated test plans
    Annex K (informative) - Derivation and
            mathematical reference for the
            optimized test plans of
            GOST R 27 402
    Annex ZA (normative) - Normative references
             to international publications
             with their corresponding European
             publications
    Bibliography

    Abstract - (Show below) - (Hide below)

    Provides a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans.

    General Product Information - (Show below) - (Hide below)

    Committee CT 56
    Development Note Classificazione CEI 56-34. (11/2006)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-HDBK-781 Revision A:1996 RELIABILITY TEST METHODS, PLANS, AND ENVIRONMENTS FOR ENGINEERING DEVELOPMENT, QUALIFICATION AND PRODUCTION
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