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CEI EN 61988-5 : 2011

Current

Current

The latest, up-to-date edition.

PLASMA DISPLAY PANELS - PART 5: GENERIC SPECIFICATION

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2011

€101.87
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Order of precedence
4 Terminology, units, symbols and abbreviations
5 Standard environmental conditions
6 Marking
7 Quality assessment procedures
8 Qualification approval procedure
9 Capability approval procedures
10 Test and measurement procedures
Annex A (normative) - Lot tolerance percentage
        defective (LTPD) sampling plans
Annex B (informative) - General description of
        specifications
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes the quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-70. (05/2011)
DocumentType
Standard
Pages
30
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 61988-5 : 2009 Identical
IEC 61988-5:2009 Identical

IEC 61988-1:2011 Plasma display panels - Part 1: Terminology and letter symbols
EN 61988-1:2011 Plasma display panels - Part 1: Terminology and letter symbols
EN 61988-4 : 2007 PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS
IEC 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
IEC 61988-3-1:2005 Plasma display panels - Part 3-1: Mechanical interface
IECQ 01:2014 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
ISO 3534-2:2006 Statistics — Vocabulary and symbols — Part 2: Applied statistics
IEC 61988-4:2007 Plasma display panels - Part 4: Climatic and mechanical testing methods
ISO 2859-10:2006 Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
EN 61988-2-2:2003 Plasma display panels - Part 2-2: Measuring methods - Optoelectrical
EN 61988-3-1:2005 Plasma display panels - Part 3-1: Mechanical interface
EN 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
IEC 61988-2-2:2003 Plasma display panels - Part 2-2: Measuring methods - Optoelectrical

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