CEI EN 62276 : 2013
Current
The latest, up-to-date edition.
SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
Hardcopy , PDF
English
01-01-2013
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging, delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections - Front surface inspection method
Annex A (normative) - Expression using Euler angle
description for piezoelectric single crystals
Annex B (informative) - Manufacturing process
for SAW wafers
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Pertains to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Committee |
CT 309
|
DevelopmentNote |
Classificazione CEI 309-40. (12/2013) 2ED 2013 Edition is valid until 28-11-2019. (06/2017)
|
DocumentType |
Standard
|
Pages |
48
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Standards | Relationship |
EN 62276:2016 | Identical |
IEC 62276:2016 | Identical |
IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
EN 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
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