Skip to content
Please enter a keyword to search

  • IEC 60758:2016

    Current The latest, up-to-date edition.

    Synthetic quartz crystal - Specifications and guidelines for use

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, English - French

    Published date:  18-05-2016

    Publisher:  International Electrotechnical Committee

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Specification for synthetic quartz
      crystal
    5 Specification for lumbered synthetic
      quartz crystal
    6 Inspection rule for synthetic quartz
      crystal and lumbered synthetic quartz
      crystal
    7 Guidelines for the use of synthetic quartz
      crystal for piezoelectric applications
    Annex A (informative) - Frequently used sampling
            procedures
    Annex B (informative) - Numerical example
    Annex C (informative) - Example of reference
            sample selection
    Annex D (informative) - Explanations of point
            callipers
    Annex E (informative) - Infrared absorbance alpha
            value compensation
    Annex F (informative) - Differences of the orthogonal
            axial system for quartz between IEC standard
            and IEEE standard
    Annex G (informative) - alpha value measurement
            consistency between dispersive infrared spectrometer
            and fourier transform infrared spectrometer
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 60758:2016 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications. This edition includes the following significant technical changes with respect to the previous edition:
    - order rearrangement and review of terms and definitions;
    - abolition as a standard of the infrared absorbance coefficient α3410;
    - addition of the value measurement explanation by FT-IR equipment in annex;
    - addition of the synthetic quartz crystal standards for optical applications.

    General Product Information - (Show below) - (Hide below)

    Committee TC 49
    Development Note Supersedes 91/28919 DC. (07/2004) Stability date: 2020. (05/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    09/30207175 DC : 0 BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD
    PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
    04/30111604 DC : 0 IEC 61994-4-4 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION GLOSSARY - PART 4-4: MATERIALS FOR SAW DEVICES
    DD IEC/TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric materials. Synthetic quartz crystal
    EN IEC 63041-2:2018 Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors
    I.S. EN IEC 63041-1:2018 PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS
    15/30318551 DC : 0 BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS
    CEI EN 62276 : 2013 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
    EN IEC 63041-1:2018 Piezoelectric sensors - Part 1: Generic specifications
    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    I.S. EN IEC 63041-2:2018 PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS
    IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
    00/201812 DC : DRAFT APR 2000 IEC 61994-4-1 TS/ED. 1 - GLOSSARY FOR PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - PART 4-1: SYNTHETIC QUARTZ CRYSTAL
    03/108069 DC : DRAFT MAY 2003 IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD
    IEC PAS 62276:2001 Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
    BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
    I.S. EN 62276:2016 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
    EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    IEC TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    ISO 15368:2001 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
    IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
    View more information

    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective