CEI EN 62417 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MOBILE ION TESTS FOR METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTORS (MOSFETS)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2011
Publisher
€33.08
Excluding VAT
FOREWORD
1 Scope
2 Abbreviations and letter symbols
3 General description
4 Test equipment
5 Test structures
6 Sample size
7 Conditions
8 Procedure
9 Criteria
10 Reporting
Gives a wafer level test procedure to determine the amount of positive mobile charge in oxide layers in metal-oxide semiconductor field effect transistors.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-26. (06/2011)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62417:2010 | Identical |
| EN 62417:2010 | Identical |
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