CEI EN 62433-2 : 2011
Current
The latest, up-to-date edition.
EMC IC MODELLING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELLING (ICEM-CE)
Hardcopy , PDF
English
01-01-2011
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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for XML
representation
Annex B (normative) - CEML valid keywords and usage
Annex C (informative) - Example of ICEM-CE macro-model
in CEML format
Annex D (informative) - Conversions between parameter types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) - Conducted emission prediction at
PCB level
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Defines macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-75. (05/2011) 1ED 2011 Edition is valid until 03-03-2020. (10/2017)
|
| DocumentType |
Standard
|
| Pages |
50
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 62433-2:2017 | Identical |
| IEC 62433-2:2017 | Identical |
| CISPR 17:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
| EN 55017 : 2011 | METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011) |
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