• EN 62433-2:2017

    Current The latest, up-to-date edition.

    EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

    Available format(s): 

    Language(s): 

    Published date:  12-05-2017

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms, definitions, abbreviations and conventions
    4 Philosophy
    5 ICEM-CE basic components
    6 IC macro-models
    7 CEML format
    8 Requirements for parameter extraction
    Annex A (normative) - Preliminary definitions for
            XML representation
    Annex B (normative) - CEML valid keywords and usage
    Annex C (informative) - Example of ICEM-CE
            macro-model in CEML format
    Annex D (informative) - Conversions between parameter
            types
    Annex E (informative) - Model parameter generation
    Annex F (informative) - Decoupling capacitors optimization
    Annex G (informative) - Conducted emission prediction
    Annex H (informative) - Conducted emission prediction
            at PCB level
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    IEC 62433-2:2008(E) specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emmissions through power supply terminals and ground reference structure; - conducted emmisions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47A
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    EN 62433-4:2016 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
    CEI EN 62433-4 : 1ED 2017 EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)
    BS EN 62433-4:2016 EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
    CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
    IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
    EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)
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