CEI EN 62506 : 2014
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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METHODS FOR PRODUCT ACCELERATED TESTING
Hardcopy , PDF
25-04-2024
English
01-01-2014
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviations
4 General description of the accelerated test methods
5 Accelerated test models
6 Accelerated testing strategy in product development
7 Limitations of accelerated testing methodology
Annex A (informative) - Highly accelerated limit
test (HALT)
Annex B (informative) - Accelerated reliability
compliance and growth test design
Annex C (informative) - Comparison between
HALT and conventional accelerated testing
Annex D (informative) - Estimating the activation
energy, E[a]
Annex E (informative) - Calibrated accelerated
life testing (CALT)
Annex F (informative) - Example on how to
estimate empirical factors
Annex G (informative) - Determination of acceleration
factors by testing to failure
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Gives guidance on the application of various accelerated test techniques for measurement or improvement of product reliability.
| Committee |
CT 56
|
| DevelopmentNote |
Classificazione CEI 56-69. (04/2014)
|
| DocumentType |
Standard
|
| Pages |
96
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 62506:2013 | Identical |
| EN 62506 : 2013 | Identical |
| IEC 61125:1992 | Unused hydrocarbon based insulating liquids - Test methods for evaluating the oxidation stability |
| IEC 61649:2008 | Weibull analysis |
| IEC 61014:2003 | Programmes for reliability growth |
| IEC 62429:2007 | Reliability growth - Stress testing for early failures in unique complex systems |
| IEC 62303:2008 | Radiation protection instrumentation - Equipment for monitoring airborne tritium |
| EN 60300-3-1:2004 | Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology |
| EN 61649:2008 | Weibull analysis |
| IEC TR 62380:2004 | Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment |
| IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
| EN 61710:2013 | Power law model - Goodness-of-fit tests and estimation methods |
| IEC 61124:2012 | Reliability testing - Compliance tests for constant failure rate and constant failure intensity |
| EN 62429:2008 | Reliability growth - Stress testing for early failures in unique complex systems |
| IEC 61164:2004 | Reliability growth - Statistical test and estimation methods |
| IEC 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
| IEC 60605-2:1994 | Equipment reliability testing - Part 2: Design of test cycles |
| EN 61014:2003 | Programmes for reliability growth |
| EN 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
| EN 61164:2004 | Reliability growth - Statistical test and estimation methods |
| EN 61124:2012 | RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY (IEC 61124:2012) |
| IEC 61710:2013 | Power law model - Goodness-of-fit tests and estimation methods |
| IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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