CEI EN 62788-1-2 : 1ED 2017
Current
The latest, up-to-date edition.
MEASUREMENT PROCEDURES FOR MATERIALS USED IN PHOTOVOLTAIC MODULES - PART 1-2: ENCAPSULANTS - MEASUREMENT OF VOLUME RESISTIVITY OF PHOTOVOLTAIC ENCAPSULANTS AND OTHER POLYMERIC MATERIALS
20-03-2017
FOREWORD
1 Scope
2 Normative references
3 Sampling
4 Apparatus
5 Procedure
6 Test report
Annex A (informative) - Historical studies of the volume
resistivity of encapsulation materials
Annex B (informative) - Example data
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Specifies a method and guidelines for measuring the volume resistivity of materials used as encapsulation, edge seals, front-sheets, backsheets, or any other insulating material in a photovoltaic (PV) module.
| Committee |
CT 82
|
| DevelopmentNote |
Classificazione CEI 82-57. (03/2017)
|
| DocumentType |
Standard
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62788-1-2:2016 | Identical |
| EN 62788-1-2:2016 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| IEC 61340-2-3:2016 | Electrostatics - Part 2-3: Methods of test for determining the resistance and resistivity of solid materials used to avoid electrostatic charge accumulation |
| IEC 62631-3-2:2015 | Dielectric and resistive properties of solid insulating materials - Part 3-2: Determination of resistive properties (DC methods) - Surface resistance and surface resistivity |
| EN 62631-3-2:2016 | Dielectric and resistive properties of solid insulating materials - Part 3-2: Determination of resistive properties (DC Methods) - Surface resistance and surface resistivity |
| ASTM D 257 : 2014 : REDLINE | Standard Test Methods for DC Resistance or Conductance of Insulating Materials |
| EN 61340-2-3:2016 | Electrostatics - Part 2-3: Methods of test for determining the resistance and resistivity of solid materials used to avoid electrostatic charge accumulation |
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