CEI EN IEC 60749-18 : 2019
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose) Sommario
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2019
Publisher
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-6755-4
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-18:2019 | Identical |
| IEC 60749-18:2019 | Identical |
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