CEI EN IEC 60749-20:2020
Current
Current
The latest, up-to-date edition.
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-12-2020
Publisher
Semiconductor devices - Mechanical and climatic test methods Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Committee |
TC 47
|
DocumentType |
Test Method
|
ISBN |
978-2-8322-8727-9
|
Pages |
0
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Supersedes |
Standards | Relationship |
EN IEC 60749-20:2020 | Identical |
IEC 60749-20:2020 | Identical |
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