CEN/TR 10353:2011

Foreword
1 Scope
2 Normative references
3 Principle
4 Reagents
5 Apparatus
6 Sampling
7 Procedure
8 Expression of results
9 Precision
10 Test report
Annex A (informative) - Plasma optical emission
        spectrometer - Suggested performance
        criteria to be checked
Annex B (informative) - Test samples used for
        the precision test
Annex C (informative) - Detailed results obtained
        from the precision test
Bibliography

This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in Ferro Silicon materials. The method is applicable to: - Al content between 0,2 and 2 %;- Ti content between 0,02 and 0,25 %;- P content between 0,005 and 0,05 %.This Technical Report also describes the general requirements for analysis by inductively coupled plasma optical emission spectrometry, the preparation and dissolution of the test sample and the method of calculation of the results.The procedure is valid for the analytical lines given in Table 1. This table also gives, for each line, the spectral interferences, which must be accurately corrected.NOTEThe interferences extend as well as other possible interferences depend on the temperature in the plasma and on the optical resolution of the spectrometer used.Table 1 - Spectral lines suggested together with the interferences which shall be correctedElementWavelength (nm)InterferencesAl308,22VTi337,28V, NiP178,29Mo