DD IEC PAS 61338-1-5 : DRAFT JULY 2010
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
30-09-2015
23-11-2012
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and sigma[i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of equation (4)
for R[i]
Annex B (informative) - Calculation uncertainty of
parameters in Figure 3
Bibliography
Provides a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate designated as R[i] and sigma[i] respectively, and are called interface resistance and interface conductivity.
| Committee |
EPL/49
|
| DocumentType |
Draft
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC PAS 61338-1-5:2010 | Identical |
| IEC 61338-1-4:2005 | Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency |
| IEC 61338-1-3:1999 | Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
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