DD IEC TS 62396-2 : DRAFT OCT 2008

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document
5 Obtaining SEE data
  5.1 Types of SEE data
  5.2 Use of existing SEE data
  5.3 Deciding to perform dedicated SEE tests
6 Availability of existing SEE data for avionics applications
  6.1 Variability of SEE data
  6.2 Types of existing SEE data that may be used
      6.2.1 Sources of data, proprietary versus published data
      6.2.2 Data based on the use of different sources
      6.2.3 Ground level versus avionics applications
  6.3 Sources of existing data
7 Considerations for SEE testing
  7.1 General
  7.2 Selection of hardware to be tested
  7.3 Selection of test method
  7.4 Selection of facility providing energetic particles
      7.4.1 Radiation sources
      7.4.2 Spallation neutron source
      7.4.3 Monoenergetic and quasi-monoenergetic beam sources
      7.4.4 Thermal neutron sources
8 Converting test results to avionics SEE rates
  8.1 General
  8.2 Use of spallation neutron source
  8.3 Use of SEU cross section curve over energy
Bibliography

Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.