• DIN EN 60444-5:1997-10

    Current The latest, up-to-date edition.

    MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 5: METHODS FOR THE DETERMINATION OF EQUIVALENT ELECTRICAL PARAMETERS USING AUTOMATIC NETWORK ANALYSER TECHNIQUES AND ERROR CORRECTION

    Available format(s):  Hardcopy, PDF

    Language(s):  German

    Published date:  01-01-1997

    Publisher:  German Institute for Standardisation (Deutsches Institut für Normung)

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Methods
    1 Scope
    2 Introduction
    3 Measurement procedures
    4 Choice of admittance measurement method
    5 Calibration techniques
    6 Low-frequency measurements
    7 Admittance analysis and estimation of the equivalent
        circuit parameters
    8 Measurement errors, instrumentation and test fixtures
    Annexes
    A (normative) Calibration
    B (informative) Low-frequency measurement
    C (informative) Bibliography
    Figures
    1 Measurement sequence
    2 Measurement methods, admittance analysis and parameter
        estimation techniques
    3 One-port equivalent circuit of a single-mode quartz
        crystal unit
    4 Two-port equivalent circuit of a single-mode quartz
        crystal unit
    5 Admittance and impedance circle of a quartz crystal
        unit for frequencies near an isolated mode of vibration
    6 General one-port equivalent circuit for multiple
        resonance
    7 Two-port equivalent circuit for multiple resonances
    8 Procedure for the determination of the equivalent
        circuit parameters of a quartz crystal unit
    9 Calibration verification for S-parameter measurement
    10 APC-3.5 Transmission fixture
    11 APC-7 Transmission fixture
    12 APC-7 Reflection fixture
    13 APC-3.5 One-port fixture
    14 APC 3.5 Two-port fixture
    15 Direct transmission measurement fixture
        A.1 Simplified one-port network analyzer
        A.2 Simplified two-port, three-channel network analyzer
        A.3 Signal flowgraph representation for proposed
              12-term error model
        A.4 Typical direct transmission system
        A.5 Equivalent circuit for direct transmission method
        A.6 Thin-film calibration resistor
        A.7 Modified SMA terminating resistor
        B.1 Simplified network analyzer test system for
              low-frequency measurements
        B.2 1 : 2 Directional bridge for low-frequency
              measurements
        B.3 1 : 1 Directional bridge for low-frequency
              measurements
    Annex ZA (normative) Normative references to international
    publications with their corresponding European publications

    Abstract - (Show below) - (Hide below)

    Establishes methods for the determination of the best representations of modes in quartz crystal resonators using linear equivalent circuits.

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    Document Type Standard
    Publisher German Institute for Standardisation (Deutsches Institut für Normung)
    Status Current
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