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DIN EN 60749-30:2011-12

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011); German version EN 60749-30:2005 + A1:2011

Available format(s)

Hardcopy , PDF

Superseded date

01-02-2023

Language(s)

German

Published date

01-12-2011

€79.72
Excluding VAT

1 Scope
2 Normative references
3 General description
4 Test apparatus and materials
  4.1 Moisture chamber
  4.2 Solder equipment
  4.3 Optical microscope
  4.4 Electrical test equipment
  4.5 Drying (bake) oven
  4.6 Temperature cycle chamber (optional)
5 Procedure
  5.1 General
  5.2 Initial measurements
  5.3 Temperature cycling (optional)
  5.4 Drying (bake out)
  5.5 Soak conditions for dry-packed SMDs
  5.6 Method C for soak conditions for
       non-dry-packed SMDs in accordance with
       IEC 60749-20
  5.7 Solder reflow
  5.8 Flux application simulation (optional)
  5.9 Final measurements
  5.10 Applicable reliability tests
6 Summary
Annex ZA (normative) Normative references to international
                     publications with their corresponding
                     European publications

DevelopmentNote
Supersedes DIN IEC 60749-30 (06/2005)
DocumentType
Standard
Pages
14
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Superseded
SupersededBy
Supersedes

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