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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC ENCAPSULATED DEVICES (INTERNALLY INDUCED)
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Available format(s): Hardcopy, PDF
Language(s): German
Published date: 01-01-2003
Publisher: German Institute for Standardisation (Deutsches Institut für Normung)
ForewordINTRODUCTION1 Scope and object2 Normative references3 Test procedure
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
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