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  • BS EN 60749-31:2003

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  04-07-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    INTRODUCTION
    1 Scope and object
    2 Normative references
    3 Test procedure

    Abstract - (Show below) - (Hide below)

    Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.

    Scope - (Show below) - (Hide below)

    Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

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    Committee EPL/47
    Development Note Supersedes BS EN 60749. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes
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