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DIN EN 60749-40:2012-02

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE (IEC 60749-40:2011)

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2012

DevelopmentNote
Supersedes DIN IEC 60749-40. (02/2012)
DocumentType
Standard
Pages
23
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current
Supersedes

Standards Relationship
EN 60749-40 : 2011 Identical
IEC 60749-40:2011 Identical

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