DIN EN 62047-3:2007-02
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 3: THIN FILM STANDARD TEST PIECE FOR TENSILE-TESTING
Hardcopy , PDF
German
01-01-2007
Important note : Users cannot be edited or removed once added to your Multi user PDF.
Scope
2 Normative references
3 Test piece materials
4 Test piece fabrications
5 Plane shape of test piece
6 Test piece thickness
7 Gauge mark
8 Test
9 Document attached to standard test pieces
Annex A (informative) Test piece
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10[mu]m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices.
| DevelopmentNote |
Supersedes DIN IEC 62047-3. (02/2007)
|
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NBN EN 62047-3 : 2007 | Identical |
| I.S. EN 62047-3:2006 | Identical |
| NF EN 62047-3 : 2006 | Identical |
| EN 62047-3 : 2006 | Identical |
| IEC 62047-3:2006 | Identical |
| BS EN 62047-3:2006 | Identical |
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