DS EN 60749-24 : 2004
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
12-01-2013
Defines the reliability of non-hermetic packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
| DocumentType |
Standard
|
| PublisherName |
Danish Standards
|
| Status |
Current
|
| SupersededBy |
| Standards | Relationship |
| EN 60749-24:2004 | Identical |
| IEC 60749-24:2004 | Identical |
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