IEC 60749-24:2004
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Hardcopy , PDF
English, English - French
09-03-2004
27-11-2025
FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62336. (03/2004) Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NF EN 60749-24 : 2005 | Identical |
| NEN EN IEC 60749-24 : 2004 | Identical |
| I.S. EN 60749-24:2004 | Identical |
| PN EN 60749-24 : 2006 | Identical |
| BS EN 60749-24:2004 | Identical |
| CEI EN 60749-24 : 2012 | Identical |
| EN 60749-24:2004 | Identical |
| DIN EN 60749-24:2004-09 | Identical |
| SAC GB/T 4937.24:2025 | Identical |
| UNE-EN 60749-24:2005 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : Users cannot be edited or removed once added to your Multi user PDF.