• There are no items in your cart

DSCC 12229D:2023

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL, CMOS, MICROPROCESSOR WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON

Published date

25-09-2023

Sorry this product is not available in your region.

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.